Atomic Force Microscopy Fundamentals and Applications

Atomic Force Microscopy Fundamentals and Applications

AngličtinaMäkká väzbaTlač na objednávku
Solanki, Vanarajsinh
LAP Lambert Academic Publishing
EAN: 9786200247247
Tlač na objednávku
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Podrobné informácie

This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.
EAN 9786200247247
ISBN 6200247242
Typ produktu Mäkká väzba
Vydavateľ LAP Lambert Academic Publishing
Stránky 60
Jazyk English
Rozmery 220 x 150
Autori Dasadia, Abhay; Mishra, Pramita; Solanki, Vanarajsinh