Atomic Force Microscopy Fundamentals and Applications

Atomic Force Microscopy Fundamentals and Applications

EnglishPaperback / softbackPrint on demand
Solanki, Vanarajsinh
LAP Lambert Academic Publishing
EAN: 9786200247247
Print on demand
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Detailed information

This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.
EAN 9786200247247
ISBN 6200247242
Binding Paperback / softback
Publisher LAP Lambert Academic Publishing
Pages 60
Language English
Dimensions 220 x 150
Authors Dasadia, Abhay; Mishra, Pramita; Solanki, Vanarajsinh