Kristallinität und Fehlordnung: Charakterisierung und technologische Bedeutung

Kristallinität und Fehlordnung: Charakterisierung und technologische Bedeutung

GermanPaperback / softback
Steinkopff
EAN: 9783798504578
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7) Kryszewski, M. and A. Szymanski, Macromol. Rev. 4D, 183 (1970). The density and the energetic situation of local 8) Bassler, H., Kunststoffe 62, 115 (1972). i;::ed levels at the polymer surface and bulk and their 9) Rose, A., Helv. Phys. Acta 29, 199 (1956). occupancy probability of excess electrons or defect 10) Many, A., Y. Goldstein and N. B. Grover electrons determine the electrostatic charging of Semiconductor Surfaces, 139 (Amsterdam 1971): polymer solids associated with the contact of met 11) Many, A., N. B. Grover, Y. Goldstein and E. als. Accumulation layers of excesselectrons and de Harnik, ]. Phys. Chern. Solids 14, ]D 5, 298 (1960). pletion layers of defectelectrons can exist near the 12) Many, A., Y. Goldstein and N. B. Grover polymer surface depending on the electrical potential Semiconductor Surfaces, 185 (Amsterdam 1971): of the contacting metal. These layers are caused by 13) Ryvktn, S. M., Photoelectric Effects in Semi the difference between the physical states of the poly conductors, 252 (New York 1964). mer surface and bulk. The energetic situation of the 14) Cholvdry, A. and C. R. Westgate, ]. Phys. D: localized levels is determined by intermolecular inter Appl. Phys. 7, 713 (1974). actions and therefore it depends on the state of 15) Many, A., Y. Goldstein and N. B. Grover, order of the surface and the bulk. Semiconductor Surfaces, 136 (Amsterdam 1971).
EAN 9783798504578
ISBN 3798504571
Binding Paperback / softback
Publisher Steinkopff
Publication date January 1, 1976
Pages 242
Language German
Dimensions 279 x 210
Country Germany
Readership Professional & Scholarly
Illustrations V, 242 S. 42 Abb.
Editors Fischer, E.W.; Kausch, H.H.; Muller, F.H.
Series Aktuelle Probleme der Polymer-Physik