Einstein Relation in Compound Semiconductors and Their Nanostructures

Einstein Relation in Compound Semiconductors and Their Nanostructures

EnglishHardback
Ghatak Kamakhya Prasad
Springer, Berlin
EAN: 9783540795568
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In recent years, with the advent of ?ne line lithographical methods, molecular beam epitaxy, organometallic vapour phase epitaxy and other experimental techniques, low dimensional structures having quantum con?nement in one, two and three dimensions (such as inversion layers, ultrathin ?lms, nipi's, quantum well superlattices, quantum wires, quantum wire superlattices, and quantum dots together with quantum con?ned structures aided by various other ?elds) have attracted much attention, not only for their potential in uncovering new phenomena in nanoscience, but also for their interesting applications in the realm of quantum e?ect devices. In ultrathin ?lms, due to the reduction of symmetry in the wave-vector space, the motion of the carriers in the direction normal to the ?lm becomes quantized leading to the quantum size e?ect. Such systems ?nd extensive applications in quantum well lasers, ?eld e?ect transistors, high speed digital networks and also in other low dimensional systems. In quantum wires, the carriers are quantized in two transverse directions and only one-dimensional motion of the carriers is allowed. The transport properties of charge carriers in quantum wires, which may be studied by utilizing the similarities with optical and microwave waveguides, are currently being investigated. Knowledge regarding these quantized structures may be gained from original research contributions in scienti?c journals, proceedings of international conferences and various - view articles.
EAN 9783540795568
ISBN 3540795561
Binding Hardback
Publisher Springer, Berlin
Publication date November 20, 2008
Pages 458
Language English
Dimensions 235 x 155
Country Germany
Readership Professional & Scholarly
Authors Bhattacharya Sitangshu; De Debashis; Ghatak Kamakhya Prasad
Illustrations XX, 458 p. 253 illus.
Series Springer Series in Materials Science