Software Defect and Operational Profile Modeling

Software Defect and Operational Profile Modeling

EnglishPaperback / softbackPrint on demand
Kai-Yuan Cai
Springer-Verlag New York Inc.
EAN: 9781461375593
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Detailed information

also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
EAN 9781461375593
ISBN 1461375592
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date October 12, 2012
Pages 268
Language English
Dimensions 235 x 155
Country United States
Readership General
Authors Kai-Yuan Cai
Illustrations XIX, 268 p.
Edition Softcover reprint of the original 1st ed. 1998
Series International Series in Software Engineering
Manufacturer information
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