Random Testing of Digital Circuits

Random Testing of Digital Circuits

EnglishHardbackPrint on demand
David Rene
Taylor & Francis Inc
EAN: 9780824701826
Print on demand
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Detailed information

"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
EAN 9780824701826
ISBN 0824701828
Binding Hardback
Publisher Taylor & Francis Inc
Publication date April 8, 1998
Pages 500
Language English
Dimensions 229 x 152
Country United States
Readership Professional & Scholarly
Authors David Rene
Manufacturer information
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