Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography

AngličtinaMäkká väzbaTlač na objednávku
Larson David J.
Springer-Verlag New York Inc.
EAN: 9781493952434
Tlač na objednávku
Predpokladané dodanie v stredu, 11. septembra 2024
169,03 €
Bežná cena: 187,81 €
Zľava 10 %
ks
Chcete tento titul ešte dnes?
kníhkupectvo Megabooks Banská Bystrica
nie je dostupné
kníhkupectvo Megabooks Bratislava
nie je dostupné
kníhkupectvo Megabooks Košice
nie je dostupné

Podrobné informácie

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.
EAN 9781493952434
ISBN 1493952439
Typ produktu Mäkká väzba
Vydavateľ Springer-Verlag New York Inc.
Dátum vydania 27. augusta 2016
Stránky 318
Jazyk English
Rozmery 235 x 155
Krajina United States
Čitatelia Professional & Scholarly
Autori Geiser Brian P.; Kelly Thomas F.; Larson David J.; Prosa Ty J.; Ulfig Robert M.
Ilustrácie XVII, 318 p. 164 illus., 54 illus. in color.
Edícia Softcover reprint of the original 1st ed. 2013